发明授权
US06414311B1 Spectrometer accessory for carrying out attenuated total reflectance measurements 有权
用于进行衰减全反射测量的光谱仪附件

  • 专利标题: Spectrometer accessory for carrying out attenuated total reflectance measurements
  • 专利标题(中): 用于进行衰减全反射测量的光谱仪附件
  • 申请号: US09383243
    申请日: 1999-08-26
  • 公开(公告)号: US06414311B1
    公开(公告)日: 2002-07-02
  • 发明人: Christopher WoodIan Alcock
  • 申请人: Christopher WoodIan Alcock
  • 优先权: GB98306956 19980828
  • 主分类号: G01N2135
  • IPC分类号: G01N2135
Spectrometer accessory for carrying out attenuated total reflectance measurements
摘要:
An accessory for carrying out ATR measurements in a spectrometer such as an FT-IR spectrometer. The accessory has input optical elements for directing a beam of infra-red radiation. to an HATR crystal 75 and output optical elements for directing radiation leaving the crystal towards an IR detector. The optical elements include a pivotable element which is adjustable automatically to a position in which it causes the radiation to be incident on the crystal at an angle of incidence appropriate for that crystal.
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