发明授权
- 专利标题: Method for improving the durability of ion insertion materials
- 专利标题(中): 提高离子插入材料耐久性的方法
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申请号: US09532168申请日: 2000-03-21
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公开(公告)号: US06420071B1公开(公告)日: 2002-07-16
- 发明人: Se-Hee Lee , C. Edwin Tracy , Hyeonsik M. Cheong
- 申请人: Se-Hee Lee , C. Edwin Tracy , Hyeonsik M. Cheong
- 主分类号: H01M614
- IPC分类号: H01M614
摘要:
The invention provides a method of protecting an ion insertion material from the degradative effects of a liquid or gel-type electrolyte material by disposing a protective, solid ion conducting, electrically insulating, layer between the ion insertion layer and the liquid or gel-type electrolyte material. The invention further provides liquid or gel-type electrochemical cells having improved durability having a pair of electrodes, a pair of ion insertion layers sandwiched between the pair of electrodes, a pair of solid ion conducting layers sandwiched between the ion insertion layers, and a liquid or gel-type electrolyte material disposed between the solid ion conducting layers, where the solid ion conducting layer minimizes or prevents degradation of the faces of the ion insertion materials facing the liquid or gel-type electrolyte material. Electrochemical cells of this invention having increased durability include secondary lithium batteries and electrochromic devices.
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