- 专利标题: Method and apparatus for providing low-GIDL dual workfunction gate doping with borderless diffusion contact
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申请号: US09982822申请日: 2001-10-22
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公开(公告)号: US06432787B1公开(公告)日: 2002-08-13
- 发明人: Jack A. Mandelman , Ramachandra Divakaruni
- 申请人: Jack A. Mandelman , Ramachandra Divakaruni
- 主分类号: H01L21336
- IPC分类号: H01L21336
摘要:
A semiconductor structure is provided along with a corresponding method of producing such a structure. The method and structure may include providing a semiconductor substrate, a gate insulator over the semiconductor substrate, a conductor comprising intrinsic polysilicon over the gate insulator, a silicide layer over the polysilicon and an insulating cap over the silicide layer. Insulating spacers may be provided along sides of the silicide layer and the insulating cap. The polysilicon may be doped with a first conductive type dopant. The first conductive type dopant may be spread over the polysilicon to form a doped polysilicon layer. A gate sidewall layer may be formed on sides of the doped polysilicon layer. A bird's beak of the gate sidewall layer may also be formed in a corner of the polysilicon.
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