发明授权
US06433314B1 Direct temperature control for a component of a substrate processing chamber 有权
用于基板处理室的部件的直接温度控制

Direct temperature control for a component of a substrate processing chamber
摘要:
An apparatus and a method of regulating temperature of a component of a processing chamber is provided. The apparatus comprises a first thermal conductor thermally connected to the component, wherein the first thermal conductor is a resistive heating element disposed adjacent the component, a second thermal conductor thermally connected to the component, wherein the second thermal conductor is a fluid channel disposed adjacent the component, the fluid channel having a fluid inlet and a fluid outlet, a controller connected to the first and second thermal conductors, providing at least one temperature sensor connected to the component to supply temperature readings to the controller. Radiative heaters in thermal communication with the component may be used in place of a resistive heating element.
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