发明授权
US06434051B1 Non-volatile memory circuit 有权
非易失性存储器电路

  • 专利标题: Non-volatile memory circuit
  • 专利标题(中): 非易失性存储器电路
  • 申请号: US09926648
    申请日: 2001-11-28
  • 公开(公告)号: US06434051B1
    公开(公告)日: 2002-08-13
  • 发明人: Toru Endo
  • 申请人: Toru Endo
  • 优先权: JP11-178614 19990624
  • 主分类号: G11C1606
  • IPC分类号: G11C1606
Non-volatile memory circuit
摘要:
The present invention provides a non-volatile memory circuit that can easily read and write. Especially, the present invention is effective to storage multi-value or analog value. The present invention has a storage transistor Nc with a floating gate and a feedback transistor Nf with a floating gate whose source are connected commonly and a load circuit is provided to the drain side of both transistors. A negative feedback circuit is provided between the drain of the storage transistor Nc and the floating gate of the feedback transistor Nf. An output transistor P2 is a preferable example of the negative feedback circuit, whose gate is connected to the drain of the storage transistor and which generates a voltage corresponding to that gate voltage at an output terminal. This output terminal and the floating gate of the feedback transistor are connected. A memory circuit of such a configuration operates so that the voltage corresponding to the charge in the floating gate of the storage transistor Nc and the output voltage of the output terminal OUT become the same. Therefore, the voltage of the floating gate of the storage transistor can be directly detected.
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