发明授权
US06436059B1 Detection of imd contact and alignment based on changes in frequency response characteristics 有权
基于频率响应特性的变化检测imd接触和对准

  • 专利标题: Detection of imd contact and alignment based on changes in frequency response characteristics
  • 专利标题(中): 基于频率响应特性的变化检测imd接触和对准
  • 申请号: US09660057
    申请日: 2000-09-12
  • 公开(公告)号: US06436059B1
    公开(公告)日: 2002-08-20
  • 发明人: Claudio I. Zanelli
  • 申请人: Claudio I. Zanelli
  • 主分类号: A61B5103
  • IPC分类号: A61B5103
Detection of imd contact and alignment based on changes in frequency response characteristics
摘要:
A method and apparatus for remotely monitoring the location of an interventional medical device (IMD) which monitors changes in frequency response characteristics of a sensor. Embodiments of the present invention may use changes in the complex impedance properties of the sensor, at antiresonance, or changes in the resonant frequency of an LC circuit to indicate whether or not the IMD is in contact with a tissue surface. The present invention is adapted for use in conjunction with a wide variety of IMDs, and in a wide variety of medical procedures.
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