发明授权
US06445192B1 Close proximity material interface detection for a microwave level transmitter 有权
用于微波级发射器的近距离材料接口检测

  • 专利标题: Close proximity material interface detection for a microwave level transmitter
  • 专利标题(中): 用于微波级发射器的近距离材料接口检测
  • 申请号: US09542677
    申请日: 2000-04-04
  • 公开(公告)号: US06445192B1
    公开(公告)日: 2002-09-03
  • 发明人: Eric R. LovegrenDavid L. Pederson
  • 申请人: Eric R. LovegrenDavid L. Pederson
  • 主分类号: G01R2704
  • IPC分类号: G01R2704
Close proximity material interface detection for a microwave level transmitter
摘要:
A method for detecting the presence of a twin peak pulse in a waveform, generated by a microwave level transmitter, that is used to detect levels of first and second material interfaces relating to materials contained in a tank. The waveform develops a twin peak pulse when the first and second material interfaces are in close proximity to one another. The twin peak pulse contains overlapping first and second received wave pulses reflected from the first and second material interfaces, respectively. The method determines that the waveform contains a twin peak pulse when both a first peak point relating to the first received wave pulse and a valley are detected. A microwave level transmitter having an interface detection module that is configured to use the method of the present invention to detect the existence of a twin peak pulse in a waveform.
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