发明授权
US06448192B1 Method for forming a high dielectric constant material 有权
形成高介电常数材料的方法

  • 专利标题: Method for forming a high dielectric constant material
  • 专利标题(中): 形成高介电常数材料的方法
  • 申请号: US09835770
    申请日: 2001-04-16
  • 公开(公告)号: US06448192B1
    公开(公告)日: 2002-09-10
  • 发明人: Vidya S. Kaushik
  • 申请人: Vidya S. Kaushik
  • 主分类号: H01L2131
  • IPC分类号: H01L2131
Method for forming a high dielectric constant material
摘要:
Highe quality silicon oxide having a plurality of monolayers is grown at a high temperature on a silicon substrate. A monolayer of silicon oxide is a single layer of silicon atoms and two oxygen atoms per silicon atom bonded thereto. The silicon oxide is etched one monolayer at a time until a desired thickness of the silicon layer is obtained. Each monolayer is removed by introducing a first gas to form a reaction layer on the silicon oxide. The gas is then purged. Then the reaction layer is activated by either another gas or heat. The reaction layer then acts to remove a single monolayer. This process is repeated until a desired amount of silicon oxide layer remains. Because this removal process is limited to removing one monolayer at a time, the removal of silicon oxide is well controlled. This allows for a precise amount of silicon oxide to remain.
信息查询
0/0