发明授权
- 专利标题: Method for manufacturing semiconductor device
- 专利标题(中): 制造半导体器件的方法
-
申请号: US09604726申请日: 2000-06-28
-
公开(公告)号: US06458713B1公开(公告)日: 2002-10-01
- 发明人: Nobuhide Yamada , Rempei Nakata , Hideshi Miyajima , Motonobu Kawai
- 申请人: Nobuhide Yamada , Rempei Nakata , Hideshi Miyajima , Motonobu Kawai
- 优先权: JP11-182057 19990628; JP11-186996 19990630
- 主分类号: H01L2131
- IPC分类号: H01L2131
摘要:
A method of forming a film, which comprises the steps of coating a liquid raw material comprising a precursor of film-forming material dissolved in a solvent, on a surface of substrate, and forming a solid film on the surface of substrate by subjecting the substrate to a plurality of heat treatments differing in heating temperature from each other. The heat treatments differing heating temperatures from each other are performed over the same single hot plate. The film to be formed may be an organic SOG film. There is also disclosed a method of manufacturing a semiconductor device, which comprises the steps of coating a liquid raw material for forming an organosilicon oxide film on a surface of semiconductor substrate, and subjecting the semiconductor substrate to a first heat treatment where the semiconductor substrate is heated in an oxidizing atmosphere and at a temperature of 200° C. or more.
信息查询