发明授权
- 专利标题: Sputtering device
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申请号: US09931852申请日: 2001-08-20
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公开(公告)号: US06461484B2公开(公告)日: 2002-10-08
- 发明人: Kamikura Yo , Naoki Yamada , Terushige Takeyama , Shuji Kumagai
- 申请人: Kamikura Yo , Naoki Yamada , Terushige Takeyama , Shuji Kumagai
- 优先权: JP2000-278962 20000913
- 主分类号: C23C1434
- IPC分类号: C23C1434
摘要:
A sputtering device is provided in which at least one target is sputtered by sputtering discharge to produce a film of target material on at least the first surface of a substrate. The sputtering device has a principal rotating mechanism that rotates the at least one target about an axis of revolution coaxial with the central axis of the substrate. The target is positioned offset from and circumferential to the central axis of the substrate coaxial with the axis of revolution. A magnet mechanism for magnetron discharge of the sputtering discharge forms a magnetic field asymmetrical to a central axis of the target and is rotated by an auxiliary rotating mechanism. The principal rotating mechanism integrates rotation of the targets with the magnet mechanism.
公开/授权文献
- US20020029959A1 Sputtering device 公开/授权日:2002-03-14
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