A burn-in system, a burn-in control technique, and a semiconductor device production method utilizing the burn-in control technique are provided. The burn-in system of the present invention comprises a plurality of burn-in devices and an independent counter terminal. Each of the burn-in devices calculates a parameter indicating the number of mounted semiconductor devices, and generates measurement data indicating quality of the individual semiconductor devices collectively subjected to a burn-in test. The counter terminal adds up the parameters and measurement data sent from the burn-in devices. The counter terminal then calculates a failure rate based on the total parameter and the measurement data, and stops the burn-in test of each of the burn-in devices when the failure rate reaches a predetermined reference value.