发明授权
US06465849B1 CMOS structure having dynamic threshold voltage 有权
CMOS结构具有动态阈值电压

  • 专利标题: CMOS structure having dynamic threshold voltage
  • 专利标题(中): CMOS结构具有动态阈值电压
  • 申请号: US10072318
    申请日: 2002-02-07
  • 公开(公告)号: US06465849B1
    公开(公告)日: 2002-10-15
  • 发明人: Yao-Wen ChangTao-Cheng Lu
  • 申请人: Yao-Wen ChangTao-Cheng Lu
  • 优先权: TW90133087A 20011231
  • 主分类号: H01L2976
  • IPC分类号: H01L2976
CMOS structure having dynamic threshold voltage
摘要:
A CMOS structure having a dynamic threshold voltage comprising of a MOS transistor, a first diode and a second diode. A first terminal of the first diode is coupled to the gate terminal of the MOS transistor and a second terminal of the first diode is coupled to the substrate of the MOS transistor. The first terminal of the second diode is coupled to a bulk voltage terminal and a second terminal of the second diode is coupled to the substrate of the MOS transistor.
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