发明授权
US06475813B1 MOCVD and annealing processes for C-axis oriented ferroelectric thin films 有权
C轴取向铁电薄膜的MOCVD和退火工艺

  • 专利标题: MOCVD and annealing processes for C-axis oriented ferroelectric thin films
  • 专利标题(中): C轴取向铁电薄膜的MOCVD和退火工艺
  • 申请号: US09929711
    申请日: 2001-08-13
  • 公开(公告)号: US06475813B1
    公开(公告)日: 2002-11-05
  • 发明人: Tingkai LiWei PanSheng Teng Hsu
  • 申请人: Tingkai LiWei PanSheng Teng Hsu
  • 主分类号: A01L2100
  • IPC分类号: A01L2100
MOCVD and annealing processes for C-axis oriented ferroelectric thin films
摘要:
A method of fabricating a c-axis ferroelectric thin film includes preparing a substrate; depositing a layer of ferroelectric material by metal organic chemical vapor deposition, including using a precursor solution having a ferroelectric material concentration of about 0.1 M/L at a vaporizer temperature of between about 140° C. to 200° C.; and annealing the substrate and the ferroelectric material at a temperature between about 500° C. to 560° C. for between about 30 minutes to 120 minutes.
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