发明授权
- 专利标题: Super critical drying of low k materials
- 专利标题(中): 低k材料的超临界干燥
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申请号: US09643531申请日: 2000-08-22
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公开(公告)号: US06486078B1公开(公告)日: 2002-11-26
- 发明人: Bharath Rangarajan , Ramkumar Subramanian , Bhanwar Singh
- 申请人: Bharath Rangarajan , Ramkumar Subramanian , Bhanwar Singh
- 主分类号: H01L2131
- IPC分类号: H01L2131
摘要:
One aspect of the present invention relates to a method of forming a low k material layer on a semiconductor substrate, involving the steps of depositing a mixture containing a low k material and a casting solvent on the semiconductor substrate; optionally contacting the mixture with a transition solvent whereby the casting solvent is removed from the mixture to form a second mixture containing the low k material and the transition solvent; contacting the second mixture with a supercritical fluid whereby the transition solvent is removed from the second mixture; and permitting the supercritical fluid to evaporate thereby forming the low k material layer.
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