Invention Grant
- Patent Title: Electrical test tool having easily replaceable electrical probe
- Patent Title (中): 电气测试工具具有易于更换的电气探头
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Application No.: US09464925Application Date: 1999-12-16
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Publication No.: US06504388B2Publication Date: 2003-01-07
- Inventor: Ralph Richard Comulada, Jr. , Michael Philip Goldowsky , John P. Karidis , Gerard McVicker , Yuet-Ying Yu
- Applicant: Ralph Richard Comulada, Jr. , Michael Philip Goldowsky , John P. Karidis , Gerard McVicker , Yuet-Ying Yu
- Main IPC: G01R3102
- IPC: G01R3102

Abstract:
Disclosed is an improved probe housing mechanism that will allow for the quick release of a probe tip from a testing tool. The invention includes a probe housing, a double cantilevered beam for holding a probe tip, and a releasable spring mechanism for holding the beam into place. The spring mechanism can be released by squeezing the spring together or by releasing a non-removable locking screw, thereby allowing the beam to be slidably removed from the probe housing for easy replacement.
Public/Granted literature
- US20020014892A1 ELECTRICAL TEST TOOL HAVING EASILY REPLACEABLE ELECTRICAL PROBE Public/Granted day:2002-02-07
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