发明授权
- 专利标题: Viterbi decoder with enhanced test function
- 专利标题(中): 维特比解码器具有增强的测试功能
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申请号: US09260381申请日: 1999-03-02
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公开(公告)号: US06504881B1公开(公告)日: 2003-01-07
- 发明人: Yong-Chan Kim
- 申请人: Yong-Chan Kim
- 优先权: KR98-6839 19980302
- 主分类号: H03M1341
- IPC分类号: H03M1341
摘要:
The present invention relates to an integrated viterbi decoder with improved test function. The viterbi decoder recovers original symbol and data bits from convolutional binary symbol stream, reducing a noise and data loss originated from a channel fading. For enhancing the test function of the viterbi decoder, the viterbi decoder of the present invention stores predetermined test control signals in a test register. During a test, the test control signals are synchronized with a test clock apart from a frame synchronous signal of the viterbi decoder. The test time of the viterbi decoder, thus, is not restricted by the frame synchronous signal. As a result, the test time of the viterbi decoder can be reduced without addition of an external pin.
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