发明授权
US06509260B1 Method of shallow trench isolation using a single mask 失效
使用单一掩模进行浅沟槽隔离的方法

  • 专利标题: Method of shallow trench isolation using a single mask
  • 专利标题(中): 使用单一掩模进行浅沟槽隔离的方法
  • 申请号: US09906899
    申请日: 2001-07-16
  • 公开(公告)号: US06509260B1
    公开(公告)日: 2003-01-21
  • 发明人: David R. EvansSheng Teng Hsu
  • 申请人: David R. EvansSheng Teng Hsu
  • 主分类号: H01L214763
  • IPC分类号: H01L214763
Method of shallow trench isolation using a single mask
摘要:
A method of shallow trench isolation includes preparing a substrate, including forming mesa structures thereon; forming a barrier cap on the mesa structures; forming an oxide multi-layer structure over the mesas and barrier caps, including: depositing a first oxide layer having a conventional polishing rate; depositing a second oxide layer having a low polishing rate; and depositing a third oxide layer having a conventional polishing rate, and polishing the structure to the level of the barrier cap.
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