发明授权
- 专利标题: Method of shallow trench isolation using a single mask
- 专利标题(中): 使用单一掩模进行浅沟槽隔离的方法
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申请号: US09906899申请日: 2001-07-16
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公开(公告)号: US06509260B1公开(公告)日: 2003-01-21
- 发明人: David R. Evans , Sheng Teng Hsu
- 申请人: David R. Evans , Sheng Teng Hsu
- 主分类号: H01L214763
- IPC分类号: H01L214763
摘要:
A method of shallow trench isolation includes preparing a substrate, including forming mesa structures thereon; forming a barrier cap on the mesa structures; forming an oxide multi-layer structure over the mesas and barrier caps, including: depositing a first oxide layer having a conventional polishing rate; depositing a second oxide layer having a low polishing rate; and depositing a third oxide layer having a conventional polishing rate, and polishing the structure to the level of the barrier cap.
公开/授权文献
- US20030013293A1 METHOD OF SHALLOW TRENCH ISOLATION USING A SINGLE MASK 公开/授权日:2003-01-16
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