发明授权
- 专利标题: Method and device for non-destructive inspection of objects by means of optical holographic interferometry
- 专利标题(中): 通过光学全息干涉法对物体进行无损检测的方法和装置
-
申请号: US09592790申请日: 2000-06-13
-
公开(公告)号: US06522409B1公开(公告)日: 2003-02-18
- 发明人: John Petter Fjeldstad , Irina Evgenievna Fjeldstad , Leonid Mikhailovich Lobanov , Vjacheslav Avtonomovich Pivtorak , Nikolay Georgievich Kuvshinsky , Galina Ivanovna Tkachuk , Vladimir Petrovich Kushniruk , Valeriy Aleksandrovich Pavlov , Nikolay Aleksandrovich Davidenko , Peter Dmitrievich Krotenko
- 申请人: John Petter Fjeldstad , Irina Evgenievna Fjeldstad , Leonid Mikhailovich Lobanov , Vjacheslav Avtonomovich Pivtorak , Nikolay Georgievich Kuvshinsky , Galina Ivanovna Tkachuk , Vladimir Petrovich Kushniruk , Valeriy Aleksandrovich Pavlov , Nikolay Aleksandrovich Davidenko , Peter Dmitrievich Krotenko
- 优先权: NO5311/99 19991029
- 主分类号: G01B9021
- IPC分类号: G01B9021
摘要:
This invention relates to a method and device for non-destructive inspection by means of holographic interferometry of details, machine units, mechanisms, and various materials, which eliminates the problem of relative displacement of the object with regard to the holographic equipment, especially due to vibratory motion of the object. This is achieved by transporting the reference and object beams between the investigated object, light source, and interferometer in flexible wave guidance cables and that the endpoints of the flexible wave guidance cables are securely attached in a fixed distance from the investigated object, recording medium of the interferometer and light source, respectively. This will also give the benefit of dividing the holographic interferometer into an object part and a registering part which forms the interferograms. Thus it becomes possible to perform measurements on objects in situ under any weather condition while the sensitive recording equipment of the holographic interferometer can be operated in a distant protected location.
信息查询