发明授权
- 专利标题: Optical characteristic measuring instrument
- 专利标题(中): 光学特性测量仪器
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申请号: US09914439申请日: 2002-03-20
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公开(公告)号: US06525883B2公开(公告)日: 2003-02-25
- 发明人: Yoko Hirohara , Naoki Nakazawa , Toshifumi Mihashi
- 申请人: Yoko Hirohara , Naoki Nakazawa , Toshifumi Mihashi
- 优先权: JP11-371951 19991227; JP2000-375206 20001208
- 主分类号: G02B2710
- IPC分类号: G02B2710
摘要:
The present invention relates to an apparatus for precise measurement of optical characteristics, and has an object to provide an optical characteristic measuring apparatus comprising a position change unit for changing the positions of beams transformed by a first transforming member, wherein a first light source emits a luminous flux of a first wavelength, a first illumination optical system illuminates a minute area on the retina of the eye under examination with the luminous flux from the first light source, a first light receiving optical system leads light to a first light receiving unit through a transforming member for transforming the luminous flux having undergone at least one of transmission and reflection at at least one surface of the object of measurement into at least nine beams, a position change unit changes the positions of the beams transformed by the first transforming member, and an arithmetic unit can determine optical characteristics of the object of measurement based on a first signal from the first light receiving unit corresponding to the angle of inclination of the luminous flux.
公开/授权文献
- US20030011757A1 OPTICAL CHARACTERISTIC MEASURING INSTRUMENT 公开/授权日:2003-01-16
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