发明授权
US06535007B2 Component holder for testing devices and component holder system microlithography
有权
用于测试设备和组件支架系统微光刻的组件支架
- 专利标题： Component holder for testing devices and component holder system microlithography
- 专利标题（中）： 用于测试设备和组件支架系统微光刻的组件支架
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申请号： US09852969申请日： 2001-05-10
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公开(公告)号： US06535007B2公开(公告)日： 2003-03-18
- 发明人: Hermann Haas , Jens Lüpke
- 申请人： Hermann Haas , Jens Lüpke
- 优先权： DE10024875 20000516
- 主分类号： G01R3102
- IPC分类号： G01R3102
摘要：
A component holder for testing electronic components having a carrier, at least one component socket arranged on the carrier and having a group of component contacts to accommodate and make contact with a component, and at least one group of adapter contacts, which are arranged in a predefined standard arrangement on the carrier and are connected to the component contacts.
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