发明授权
US06536900B2 Eye characteristic measuring apparatus 有权
眼睛特征测量仪器

  • 专利标题: Eye characteristic measuring apparatus
  • 专利标题(中): 眼睛特征测量仪器
  • 申请号: US09819354
    申请日: 2001-03-28
  • 公开(公告)号: US06536900B2
    公开(公告)日: 2003-03-25
  • 发明人: Toshifumi MihashiYoko Hirohara
  • 申请人: Toshifumi MihashiYoko Hirohara
  • 优先权: JP2000-089978 20000328
  • 主分类号: A61B310
  • IPC分类号: A61B310
Eye characteristic measuring apparatus
摘要:
The present invention is intended to provide an eye characteristic measuring apparatus having a projection system for projecting a light source image of small amount onto a fundus of an eye by a reflected light from the fundus, and a wavefront detecting system for detecting a wavefront of luminous flux emitted from the interior of the pupil of the eye by a reflected light from the fundus, where the projection system projects a light source image of small amount onto a fundus of an eye, and the wavefront detection system detects the wavefront of luminous flux emitted from the interior of the fundus by a reflected light from the fundus, and a deflection prism having at least one transmission surface for aberration correction within both optical paths of the projecting system and the wavefront detecting system, can deflect the incident luminous flux.
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