发明授权
- 专利标题: Apparatus and method for forming low dielectric constant film
- 专利标题(中): 低介电常数膜形成装置及方法
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申请号: US10079078申请日: 2002-02-19
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公开(公告)号: US06537928B1公开(公告)日: 2003-03-25
- 发明人: Nobuo Matsuki , Seijiro Umemoto , Yasuyoshi Hyodo
- 申请人: Nobuo Matsuki , Seijiro Umemoto , Yasuyoshi Hyodo
- 主分类号: H01L2131
- IPC分类号: H01L2131
摘要:
A CVD apparatus includes (i) a reaction chamber; (ii) a reaction gas inlet; (iii) a lower stage on which a semiconductor substrate is placed; (iv) an upper electrode for plasma excitation; (v) an intermediate electrode with plural pores through which the reaction gas passes, wherein a reaction space is formed between the upper electrode and the intermediate electrode; and (vi) a cooling plate disposed between the intermediate electrode and the lower stage, wherein a transition space is formed between the intermediate electrode and the cooling plate, and a plasma-free space is formed between the cooling plate and the lower stage.
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