In an exemplary embodiment of the invention, a dual test mechanism is presented for use in a circuit breaker. More specifically, the dual test mechanism includes a dual test button which comprises a single switch for testing both the AFCI and GFCI circuits of the breaker. The test mechanism includes a circuit board, which forms a part of the circuit breaker, and a test button assembly which includes a test button and signaling components which are electrically connected to the circuit board.