A semiconductor device and a method for testing the semiconductor device of the present invention includes n macro blocks which process input data supplied from input terminals and output the data from output terminals, a test circuit which supplies test data for testing the macro blocks and receives the test data processed by the macro blocks in the test mode and a test path which supplies the test data from the test circuit to the input terminal of the macro block, supplies data of the output terminal of the k-th (k=1 to (n−1)) macro block to the input terminal of the macro block to the test circuit in the test mode. One macro block can be selected randomly to be tested.