发明授权
US06548380B1 Semiconductor thin film, semiconductor device employing the same, methods for manufacturing the same and device for manufacturing a semiconductor thin film
有权
半导体薄膜,采用该半导体薄膜的半导体器件,其制造方法以及半导体薄膜的制造装置
- 专利标题: Semiconductor thin film, semiconductor device employing the same, methods for manufacturing the same and device for manufacturing a semiconductor thin film
- 专利标题(中): 半导体薄膜,采用该半导体薄膜的半导体器件,其制造方法以及半导体薄膜的制造装置
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申请号: US09658667申请日: 2000-09-08
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公开(公告)号: US06548380B1公开(公告)日: 2003-04-15
- 发明人: Masashi Goto , Mikihiko Nishitani , Masaharu Terauchi
- 申请人: Masashi Goto , Mikihiko Nishitani , Masaharu Terauchi
- 优先权: JP11-254308 19990908; JP2000-042212 20000221; JP2000-211011 20000712
- 主分类号: H01L2120
- IPC分类号: H01L2120
摘要:
By applying ion or optical energy or catalytic effects at the time of depositing a crystalline silicon thin film, improvements in crystallinity of the crystalline silicon thin film in proximities of an interface of a substrate or smoothing of its surface may be achieved. With this arrangement, it is possible to achieve improvements in crystallinity of the crystalline silicon film that is formed in a low temperature condition through CVD method and to prevent concaves and convexes from being formed on its surface or to prevent oxidation of grain fields, and it is accordingly possible to provide a thin film transistor, a semiconductor device such as a solar cell and methods for manufacturing these that exhibit superior characteristics and reliability.
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