A solution for cleaning silicon semiconductors or silicon oxides comprising H2O2, NH4OH and at least one component A selected from the group consisting of fluoro-containing compounds and other ammonium salts than NH4OH, wherein the weight ratio of H2O2 to H2O is between 1:5 and 1:50, the weight ratio of NH4OH to H2O is between 1:5 and 1:50, and the molar ratio of component A to NH4OH is between 1:10 and 1:5000 is disclosed. The solution can achieve the efficacy equivalent to that of the conventional RCA two-step cleaning solution within a shorter time by one step and effectively remove contaminants such as organics, dust and metals from the surfaces of silicon semiconductors and silicon oxides without using strong acids such as HCl and H2SO4.