- 专利标题: Semiconductor device and manufacturing method thereof
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申请号: US09531537申请日: 2000-03-20
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公开(公告)号: US06552380B1公开(公告)日: 2003-04-22
- 发明人: Tsutomu Sato , Ichiro Mizushima , Yoshitaka Tsunashima
- 申请人: Tsutomu Sato , Ichiro Mizushima , Yoshitaka Tsunashima
- 优先权: JP11-075080 19990319
- 主分类号: H01L31119
- IPC分类号: H01L31119
摘要:
A deep trench is formed in a silicon substrate. The inner surface of the trench is next coated with a thin polycrystalline silicon film (liner film) so as not to close the trench. A silicon germanium film (node electrode) is then formed on the thin polycrystalline silicon film so as not to close the trench. Next, a heat treatment is performed on the silicon germanium film thereby to flow only the silicon germanium so that the trench is filled.
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