Temperature measurement device

发明授权

US06565178B1 Temperature measurement device 失效

标题翻译：温度测量装置

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专利标题： Temperature measurement device
专利标题（中）： 温度测量装置
申请号： US10002751

申请日： 2001-10-29
公开(公告)号： US06565178B1

公开(公告)日： 2003-05-20
发明人: Matthew D Giere , Satya Prakash , Michael J. Barbour
申请人： Matthew D Giere , Satya Prakash , Michael J. Barbour
主分类号： B41J2938
IPC分类号： B41J2938

摘要：

An apparatus includes a substrate and a resistive element attached to a region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element, attached to the substrate, and formed of a second material having a second temperature coefficient of resistivity with the first material selected so that the first temperature coefficient of resistivity exceeds the second temperature coefficient of resistivity. An apparatus includes a substrate and a resistive element disposed onto a first region of the substrate and formed of a first material having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces coupled to the resistive element and each formed of a first plurality of sections of a second material having a second temperature coefficient of resistivity and a second plurality of sections of a third material having a third temperature coefficient of resistivity.

摘要（中）：

一种装置包括基板和电阻元件，该电阻元件附接到基板的区域并由具有第一温度系数电阻率的第一材料形成。另外，该装置包括耦合到该电阻元件的一对迹线，附着到该基板上，并且由第二材料形成，该第二材料具有第二温度系数的电阻率，该第一温度系数选择第一材料，使得该第一温度系数电阻率超过该第二温度系数电阻温度系数。一种设备包括衬底和设置在衬底的第一区域上并由具有第一温度系数电阻率的第一材料形成的电阻元件。另外，该装置包括耦合到电阻元件的一对迹线，并且每一个由具有第二温度系数电阻率的第二材料的第一多个部分形成，并且具有第三材料的第二多个部分具有第三温度系数的电阻率。

公开/授权文献

US20030081033A1 TEMPERATURE MEASUREMENT DEVICE 公开/授权日：2003-05-01

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