Invention Grant
US06568289B2 Planar shape characteristic measuring apparatus and planar shape characteristic measuring method 失效
平面形状特征测量装置和平面形状特征测量方法

  • Patent Title: Planar shape characteristic measuring apparatus and planar shape characteristic measuring method
  • Patent Title (中): 平面形状特征测量装置和平面形状特征测量方法
  • Application No.: US09860498
    Application Date: 2001-05-21
  • Publication No.: US06568289B2
    Publication Date: 2003-05-27
  • Inventor: Toshihiro Nakajima
  • Applicant: Toshihiro Nakajima
  • Priority: JP2000-157944 20000524
  • Main IPC: G01B730
  • IPC: G01B730
Planar shape characteristic measuring apparatus and planar shape characteristic measuring method
Abstract:
A planar shape characteristic measuring apparatus and method, which can precisely and efficiently measure the characteristics relating to a surface shape of the measured surface of a disk such as a data recording surface of an optical disk including a laser Doppler speed meter which detects a perpendicular direction speed of a measured surface of a rotating disk; a tilt angle calculating unit which calculates a tilt angle in the rotational direction of an optical disk at each measuring position to a reference surface based on a linear speed at each measuring position detected by the laser Doppler speed meter and the detected perpendicular direction speed; a displacement calculating unit which calculates a perpendicular direction displacement of the optical disk at each measuring position; an acceleration calculating unit which calculates a perpendicular direction acceleration; and a focus servo error calculating unit which calculates a focus servo error which is predicted to occur in a focus servo system.
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