发明授权
- 专利标题: Chemical amplification resist compositions and process for the formation of resist patterns
- 专利标题(中): 化学放大抗蚀剂组合物和形成抗蚀剂图案的方法
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申请号: US09757476申请日: 2001-01-11
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公开(公告)号: US06582878B2公开(公告)日: 2003-06-24
- 发明人: Takahisa Namiki , Ei Yano , Keiji Watanabe , Koji Nozaki , Miwa Igarashi , Yoko Kuramitsu
- 申请人: Takahisa Namiki , Ei Yano , Keiji Watanabe , Koji Nozaki , Miwa Igarashi , Yoko Kuramitsu
- 优先权: JP7-242033 19950920
- 主分类号: G03F7004
- IPC分类号: G03F7004
摘要:
A novel chemical amplification resist composition which comprises an alkali-soluble base resin, a photoacid generator and a dissolution inhibitor and in which a cyclic or acyclic structure constituting a matrix portion of the molecule of said dissolution inhibitor contains at least one lone pair-containing portion which can provide a hydrogen bond sufficient to shift and gather an alkali-soluble moiety of said base resin to and on a side of said molecule of the dissolution inhibitor compound. The resist composition can exhibit both excellent sensitivity and resolution and accordingly can be utilized in the formation of very fine resist patterns in a lithographic process. A method for forming such resist patterns is also disclosed.
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