• 专利标题: X-ray mapping analysis method
  • 申请号: US10153508
    申请日: 2002-05-22
  • 公开(公告)号: US06584169B2
    公开(公告)日: 2003-06-24
  • 发明人: Kiyoshi Hasegawa
  • 申请人: Kiyoshi Hasegawa
  • 优先权: JP2001-173981 20010608
  • 主分类号: G01N23223
  • IPC分类号: G01N23223
X-ray mapping analysis method
摘要:
In order to acquire typical X-ray spectra by dividing automatically dividing contained matter and regions where the density thereof differs into groups in X-ray mapping analysis, measurement starts with the spectra database empty, a designated location within the sample is irradiated with a primary beam by the primary beam control means, the sample is irradiated with the primary beam for a fixed period of time in order to acquire a measurement spectrum, the X-ray spectrum obtained through measurement and X-ray spectra in the spectra database are compared by the X-ray comparison means, the X-ray spectrum obtained through measurement is added to the database when no matching X-ray spectra exists in the database, and measurement is repeated at a designated measurement point.
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