发明授权
US06590209B1 Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution
失效
在<10 NM空间分辨率下定量测量薄结构的磁性能的技术
摘要：
A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.
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