发明授权
US06601004B2 Method and apparatus for measuring parameters of an electronic system 失效
用于测量电子系统参数的方法和装置

  • 专利标题: Method and apparatus for measuring parameters of an electronic system
  • 专利标题(中): 用于测量电子系统参数的方法和装置
  • 申请号: US09845197
    申请日: 2001-05-01
  • 公开(公告)号: US06601004B2
    公开(公告)日: 2003-07-29
  • 发明人: Alex BallantyneDavid Taylor
  • 申请人: Alex BallantyneDavid Taylor
  • 优先权: EP00303669 20000502
  • 主分类号: G01R2902
  • IPC分类号: G01R2902
Method and apparatus for measuring parameters of an electronic system
摘要:
Timing errors in digital transmission systems, such as maximum time interval error, are measured with data samples processed in a first stage to produce in real-time a first, time-varying series of measurements for a given parameter over observation intervals of a first magnitude. Each observation interval is many times longer than the sample period of the input series. Subsequent stages derive further measurements, corresponding to increasingly longer observation intervals, derived by treating previous observation intervals as sub-intervals. The first stage derives intermediate results for a predetermined interval and repeats for successive sub-intervals. The intermediate results are stored in a first first-in, first-out (FIFO) data set and updated at least once per sub-interval and the required parameter is derived. The second and subsequent stages similarly derive the required parameter corresponding to increasing observation interval magnitudes and update the measurements as data sets update.
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