Invention Grant
- Patent Title: Method of and apparatus for testing a photosensor
- Patent Title (中): 用于测试光电传感器的方法和装置
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Application No.: US09738899Application Date: 2000-12-18
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Publication No.: US06608293B2Publication Date: 2003-08-19
- Inventor: Hubert Kuderer
- Applicant: Hubert Kuderer
- Priority: DE19960910 19991217; EP00126241 20001201
- Main IPC: H01J4114
- IPC: H01J4114

Abstract:
The invention concerns a method and device to carry out the method to provide quality control for a photosensor, especially a photodiode array, whose output signal depends on the intensity of an input signal formed by electromagnetic waves. The photosensor to be tested receives stimulation signals forming the input signals while the stimulation signal intensity of the stimulation signals is varied. The associated output signals of the photosensor to be tested are measured and recorded for evaluation purposes. The photosensor preferably receives at least two independently controllable, superposed individual stimulation signals with individual intensities. The different stimulation signal intensities of the individual stimulation signals are set with the aid of a controller coupled to stimulation signal source, and the output signals of the photosensor are measured and recorded using a measurement data recorder unit.
Public/Granted literature
- US20010013572A1 Device and method to provide quality control for a photosensor Public/Granted day:2001-08-16
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