Invention Grant
- Patent Title: Method and apparatus for measurement alignment
- Patent Title (中): 用于测量对准的方法和装置
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Application No.: US09919421Application Date: 2001-07-31
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Publication No.: US06618674B2Publication Date: 2003-09-09
- Inventor: Peter J. Ireland , Tao Li , Wayne Wright , Padmanaban Namasivayam
- Applicant: Peter J. Ireland , Tao Li , Wayne Wright , Padmanaban Namasivayam
- Main IPC: G01V140
- IPC: G01V140

Abstract:
A method for aligning measurements of a hostile environment includes synchronizing at least two clocks, wherein at least a first clock is in the hostile environment, measuring characteristics of the hostile environment, aligning time domain curves of the collected measurements, correlating the curves using one or more events recorded by each clock, and correcting the curves by adding one or more time offsets. The offsets may be added to a found resent event or at other locations on the time domain curve. A second clock may be located outside the hostile environment or within a same or similar hostile environment. The collecting the measurements may be taken by a first measurement tool in a first device near the first clock and in at least a second device coupled to a second clock.
Public/Granted literature
- US20030024305A1 Method and apparatus for measurement alignment Public/Granted day:2003-02-06
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