发明授权
- 专利标题: Plasma process apparatus
- 专利标题(中): 等离子体处理装置
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申请号: US09758292申请日: 2001-01-12
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公开(公告)号: US06620290B2公开(公告)日: 2003-09-16
- 发明人: Tatsushi Yamamoto , Masaya Okamoto , Masaki Hirayama , Tadahiro Ohmi
- 申请人: Tatsushi Yamamoto , Masaya Okamoto , Masaki Hirayama , Tadahiro Ohmi
- 优先权: JP2000-005673 20000114
- 主分类号: H05H100
- IPC分类号: H05H100
摘要:
A plurality of microwave introduction windows are placed at the top wall of the reaction chamber. Microwaves of the same power are introduced into, e.g., two microwave introduction windows that are equivalent in location relationship with respect to the sidewall of the reaction chamber, while microwaves of different power are introduced into, e.g., two microwave introduction windows that are non-equivalent in location relationship with respect to the sidewall. Thus, a cost-effective plasma process apparatus is obtained which can realize uniform plasma processing even if the plasma being generated within the reaction chamber has varied load impedance.
公开/授权文献
- US20010050058A1 Plasma process apparatus 公开/授权日:2001-12-13
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