发明授权
US06630839B1 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor
失效
接触器，接触器的制造方法以及使用接触器测试电子部件的装置和方法
- 专利标题： Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor
- 专利标题（中）： 接触器，接触器的制造方法以及使用接触器测试电子部件的装置和方法
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申请号： US09531686申请日： 2000-03-20
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公开(公告)号： US06630839B1公开(公告)日： 2003-10-07
- 发明人: Makoto Haseyama , Shigeyuki Maruyama
- 申请人： Makoto Haseyama , Shigeyuki Maruyama
- 优先权： JP11-249225 19990902
- 主分类号： G01R3126
- IPC分类号： G01R3126
摘要：
A contactor is used for testing an integrated circuit electronic component provided with a plurality of electrodes. The contactor includes an insulating base material provided with holes formed at positions corresponding to the electrodes, a first conductive layer having contacts which are plastically deformed portions of the first conductive layer, and reinforcement members provided on the contacts on a first surface of the contacts. The first surface of the contacts is facing towards the holes. The contacts are provided at positions corresponding to the electrodes for enabling an electrical connection to the electronic component and are protruded from the insulating base material.
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