发明授权
US06634004B1 Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing
有权
阈值分析系统能够通过单一处理来决定存储器件中包括的所有阈值电压
- 专利标题： Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing
- 专利标题（中）： 阈值分析系统能够通过单一处理来决定存储器件中包括的所有阈值电压
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申请号： US09706696申请日： 2000-11-07
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公开(公告)号： US06634004B1公开(公告)日： 2003-10-14
- 发明人: Shinji Yamada , Hisaya Mori , Teruhiko Funakura
- 申请人： Shinji Yamada , Hisaya Mori , Teruhiko Funakura
- 优先权： JP2000-130066 20000428
- 主分类号： G11C2900
- IPC分类号： G11C2900
摘要：
In a threshold analysis method obtaining threshold voltages of all bits in a flash memory through single processing, fail bit map information is examined in order from a smaller voltage applied to the flash memory. As to a bit exhibiting a value, read from the flash memory, first mismatching a determination value, the threshold voltage is settled on the basis of a voltage applied when the bit fails in reading.
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