发明授权
- 专利标题: Tomographic wavefont analysis system and method of mapping an optical system
- 专利标题(中): 扫描波分析系统和映射光学系统的方法
-
申请号: US10167439申请日: 2002-06-13
-
公开(公告)号: US06634750B2公开(公告)日: 2003-10-21
- 发明人: Daniel R. Neal , Richard J. Copland
- 申请人: Daniel R. Neal , Richard J. Copland
- 主分类号: A61B310
- IPC分类号: A61B310
摘要:
A method of measuring aberrations of a three-dimensional structure of an optical system, such as an eye, includes creating a plurality of light beams, optically imaging the light beams and projecting the light beams onto different locations in an optical system, receiving scattered light from each of the locations, and detecting individual wavefronts of the scattered light. The plurality of light beams may be created and projected simultaneously or sequentially. A system for measuring aberrations of a three-dimensional structure of an optical system includes a light source creating a plurality of light beams, an optical imaging system optically imaging the light beams and projecting the light beams onto different locations in the target optical system, and a wavefront sensor receiving scattered light from each of the locations and detecting individual wavefronts of the scattered light.
公开/授权文献
信息查询