Invention Grant
- Patent Title: System and method for a device reliability and test circuit
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Application No.: US09896590Application Date: 2001-06-29
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Publication No.: US06636065B2Publication Date: 2003-10-21
- Inventor: George T. Galyon , King M. Chu , Jeffrey A. Newcomer , Prabjit Singh
- Applicant: George T. Galyon , King M. Chu , Jeffrey A. Newcomer , Prabjit Singh
- Main IPC: G01R3126
- IPC: G01R3126
Abstract:
An exemplary embodiment is a system and method for a device reliability test circuit. The method includes applying a DC voltage across the device for a period, wherein the DC voltage is less than the rated voltage of said device, and determining a failure point of the device based on applying the DC voltage.
Public/Granted literature
- US20030001607A1 System and method for a device reliability and test circuit Public/Granted day:2003-01-02
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