- 专利标题: Electron spin analyzer
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申请号: US09843445申请日: 2001-04-26
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公开(公告)号: US06639218B2公开(公告)日: 2003-10-28
- 发明人: Koichi Mukasa , Masayuki Ikeda , Kazuhisa Sueoka , Masakazu Mutoh , Hisao Kadono , Eisuke Ueda
- 申请人: Koichi Mukasa , Masayuki Ikeda , Kazuhisa Sueoka , Masakazu Mutoh , Hisao Kadono , Eisuke Ueda
- 优先权: JP2000-133700 20000502
- 主分类号: H01J37252
- IPC分类号: H01J37252
摘要:
A hemisphere accelerating electrode has a double structure composed of an inner accelerating electrode and an outer accelerating electrode. The inner accelerating electrode has an inner introducing inlet and an inner opening, and the outer accelerating electrode has an outer introducing inlet and an outer opening. The aperture angle of the inner introducing inlet is preferably larger than that of the outer introducing inlet by 0.1-5 degrees. Then, the aperture angle of the inner opening is preferably larger than that of the outer opening by 0.1-5 degrees. Moreover, scattered electron detectors have correcting electrodes, respectively, and are arranged in the shifted directions from the introducing direction of electrons by 100-140 degrees.
公开/授权文献
- US20020003213A1 Electron spin analyzer 公开/授权日:2002-01-10