- 专利标题: Memory chip having a test mode and method for checking memory cells of a repaired memory chip
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申请号: US10158031申请日: 2002-05-30
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公开(公告)号: US06639856B2公开(公告)日: 2003-10-28
- 发明人: Peter Beer , Carsten Ohlhoff
- 申请人: Peter Beer , Carsten Ohlhoff
- 优先权: DE10126301 20010530
- 主分类号: G11C700
- IPC分类号: G11C700
摘要:
The memory chip has regular memory cells and standby memory cells for replacing faulty memory cells. There is provided a method for checking memory cells of a repaired memory chip, where the memory cells are checked by putting the memory chip into the state before repair. This actuates the memory cells identified as being faulty in spite of the provision of standby memory cells. This allows the operability of the memory chip to be checked after the repair procedure has been carried out. It is thus possible to identify, by way of example, whether a fault has been produced by the repair procedure.