发明授权
US06645861B2 Self-aligned silicide process for silicon sidewall source and drain contacts
失效
用于硅侧壁源极和漏极触点的自对准硅化物工艺
- 专利标题: Self-aligned silicide process for silicon sidewall source and drain contacts
- 专利标题(中): 用于硅侧壁源极和漏极触点的自对准硅化物工艺
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申请号: US09836197申请日: 2001-04-18
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公开(公告)号: US06645861B2公开(公告)日: 2003-11-11
- 发明人: Cyril Cabral, Jr. , Kevin K. Chan , Guy Moshe Cohen , Kathryn Wilder Guarini , Christian Lavoie , Paul Michael Solomon , Ying Zhang
- 申请人: Cyril Cabral, Jr. , Kevin K. Chan , Guy Moshe Cohen , Kathryn Wilder Guarini , Christian Lavoie , Paul Michael Solomon , Ying Zhang
- 主分类号: H01L2144
- IPC分类号: H01L2144
摘要:
A method (and structure formed thereby) of forming a metal silicide contact on a non-planar silicon containing region having controlled consumption of the silicon containing region, includes forming a blanket metal layer over the silicon containing region, forming a silicon layer over the metal layer, etching anisotropically and selectively with respect to the metal the silicon layer, reacting the metal with silicon at a first temperature to form a metal silicon alloy, etching unreacted portions of the metal layer, annealing at a second temperature to form an alloy of metal-Si2, and selectively etching the unreacted silicon layer.
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