发明授权
US06645861B2 Self-aligned silicide process for silicon sidewall source and drain contacts 失效
用于硅侧壁源极和漏极触点的自对准硅化物工艺

Self-aligned silicide process for silicon sidewall source and drain contacts
摘要:
A method (and structure formed thereby) of forming a metal silicide contact on a non-planar silicon containing region having controlled consumption of the silicon containing region, includes forming a blanket metal layer over the silicon containing region, forming a silicon layer over the metal layer, etching anisotropically and selectively with respect to the metal the silicon layer, reacting the metal with silicon at a first temperature to form a metal silicon alloy, etching unreacted portions of the metal layer, annealing at a second temperature to form an alloy of metal-Si2, and selectively etching the unreacted silicon layer.
信息查询
0/0