Invention Grant
US06646267B1 Method for eliminating first, second and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systems 有权
用于在电子光学系统中校正三次球面像差期间消除第一,第二和第三阶轴向图像变形的方法

  • Patent Title: Method for eliminating first, second and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systems
  • Patent Title (中): 用于在电子光学系统中校正三次球面像差期间消除第一,第二和第三阶轴向图像变形的方法
  • Application No.: US09508239
    Application Date: 2000-04-24
  • Publication No.: US06646267B1
    Publication Date: 2003-11-11
  • Inventor: Maximilian HaiderStephan Uhlemann
  • Applicant: Maximilian HaiderStephan Uhlemann
  • Priority: DE19739290 19970908
  • Main IPC: H01J3710
  • IPC: H01J3710
Method for eliminating first, second and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systems
Abstract:
The invention relates to a method for eliminating axial image deformations &agr;n in electron optical systems, where the extra-axial image deformation of the order n+m with the same behavior in &agr;n, which thus has the form &agr;n&ggr;m, is modified by shifting or tilting the beam path towards the optical axis until compensation of the axial image deformation has been achieved, whereby &ggr; describes the extra-axial image coordinate as a complex number in both sections. The invention also relates to an adjustment method for eliminating all first-, second- and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systems with hexapoles.
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