Invention Grant
- Patent Title: X-ray exposure apparatus
- Patent Title (中): X射线曝光装置
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Application No.: US09859043Application Date: 2001-05-17
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Publication No.: US06647086B2Publication Date: 2003-11-11
- Inventor: Mitsuaki Amemiya , Yutaka Watanabe
- Applicant: Mitsuaki Amemiya , Yutaka Watanabe
- Priority: JP2000-148833 20000519
- Main IPC: G21K500
- IPC: G21K500

Abstract:
A proximity X-ray exposure apparatus for irradiating a reticle with X-rays generated from an X-ray source and irradiating a substrate with X-rays that have passed through the reticle. The apparatus includes a plasma X-ray source for generating X-rays by producing plasma, and a control device for controlling X-ray intensity distribution by controlling production of the plasma so that the plasma is produced at a plurality of positions in one irradiating operation of the substrate with the X-rays. The control device controls the X-ray intensity distribution in order to control the plurality of positions so that a required amount of defocusing, which is a size of a projection image corresponding to one point on the reticle formed by irradiating the reticle with X-rays generated at the plurality of positions, can be obtained.
Public/Granted literature
- US20020009176A1 X-ray exposure apparatus Public/Granted day:2002-01-24
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