发明授权
US06650421B2 Method and apparatus for inspecting optical device 失效
检测光学元件的方法和装置

  • 专利标题: Method and apparatus for inspecting optical device
  • 专利标题(中): 检测光学元件的方法和装置
  • 申请号: US09842226
    申请日: 2001-04-26
  • 公开(公告)号: US06650421B2
    公开(公告)日: 2003-11-18
  • 发明人: Nobutaka Magome
  • 申请人: Nobutaka Magome
  • 优先权: JP9-229142 19970826
  • 主分类号: G01B902
  • IPC分类号: G01B902
Method and apparatus for inspecting optical device
摘要:
In an interferometer for detecting interference light between light flux passed through an object to be inspected and reference light to be generated from a portion of the light flux passed therethrough, a phase of the interference light is detected with high precision. The light flux passed through the optical system to be inspected forms a spot image on a pinhole formed in a plate. Measuring light from the spot image and the reference-light diffracted out of the light flux from the spot image at the pinhole create interference light which in turn is received by an observation system. An image of interference fringes formed by the interference light is taken with an image pickup element. Further, heterodyne interference light is created by vibrating the plate in the direction intersecting the light flux or in the direction along the light path of the light flux, thereby detecting a phase of each portion of the interference fringes with high precision.
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