- 专利标题: Low loss high Q inductor
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申请号: US09982959申请日: 2001-10-22
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公开(公告)号: US06656813B2公开(公告)日: 2003-12-02
- 发明人: Kie Y. Ahn , Leonard Forbes
- 申请人: Kie Y. Ahn , Leonard Forbes
- 主分类号: H01L21607
- IPC分类号: H01L21607
摘要:
A high Q inductive element with low losses, high inductance and high efficiency is disclosed. The high Q inductive element with one or more inductive loops is formed over a silicon micro structure with thin support elements formed by deep plasma etching in bulk silicon. The support elements, which may have different configurations, such as walls or columns, provide mechanical stability to the inductive loops and reduce the parasitic capacitance and the losses to the substrate.
公开/授权文献
- US20020020895A1 Low loss high Q inductor 公开/授权日:2002-02-21
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