发明授权
- 专利标题: Built-in self-testing for embedded memory
- 专利标题(中): 嵌入式内存内置自检功能
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申请号: US09566621申请日: 2000-05-08
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公开(公告)号: US06668347B1公开(公告)日: 2003-12-23
- 发明人: Anthony Babella , Patrick P. Chan , Chih-Jen (Mike) Lin , Thomas J. Shewchuk , Daniel S. Lee
- 申请人: Anthony Babella , Patrick P. Chan , Chih-Jen (Mike) Lin , Thomas J. Shewchuk , Daniel S. Lee
- 主分类号: G01R3128
- IPC分类号: G01R3128
摘要:
An integrated circuit having a central built-in self-test unit (BIST) that uses internal scan chains for testing embedded memory modules. The embedded memory modules receive address and data signals from a set of input flip-flops configured to form a scan chain. The BIST is coupled to an input scan chain and includes a pattern generator to shift a test pattern into the input scan chain for testing the embedded memory modules. Output flip-flops capture data from the embedded memory modules are also configured as a scan chain. The BIST includes address control logic to bypass the normal addressing logic of the embedded memory module when the BIST operates is operating in a memory test mode.