发明授权
- 专利标题: Exposure apparatus
- 专利标题(中): 曝光装置
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申请号: US10084352申请日: 2002-02-28
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公开(公告)号: US06686989B2公开(公告)日: 2004-02-03
- 发明人: Shigeru Hagiwara , Masato Hamatani
- 申请人: Shigeru Hagiwara , Masato Hamatani
- 优先权: JP9/75355 19970327
- 主分类号: G03B2752
- IPC分类号: G03B2752
摘要:
In the exposure apparatus of the present invention, a sealed chamber defined by a first lens and a second lens in an input lens system on a plane of incidence of a fly-eye lens in an illumination optical system is provided. In a gas exchanging step, the impurity gas in the sealed chamber is first exhausted through an electromagnetic valve provided with a check valve and a gas exhaust pipe, using a gas exhaust pump and then, a high-purity nitrogen gas is supplied from a gas bomb through a gas supply pipe and an electromagnetic valve provided with a check valve to the sealed chamber. Using a pressure sensor provided in the sealed chamber, the gas exchanging step is repeated while maintaining an amount of change in pressure in the sealed chamber within a predetermined allowable range, to thereby reduce the concentration of impurities in the gas in the sealed chamber to a target value.
公开/授权文献
- US20020135744A1 Exposure apparatus 公开/授权日:2002-09-26
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