发明授权
- 专利标题: Vertical replacement-gate junction field-effect transistor
- 专利标题(中): 垂直取代栅结场效应晶体管
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申请号: US09950384申请日: 2001-09-10
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公开(公告)号: US06690040B2公开(公告)日: 2004-02-10
- 发明人: Samir Chaudhry , Paul Arthur Layman , John Russell McMacken , Ross Thomson , Jack Qingsheng Zhao
- 申请人: Samir Chaudhry , Paul Arthur Layman , John Russell McMacken , Ross Thomson , Jack Qingsheng Zhao
- 主分类号: H01L2932
- IPC分类号: H01L2932
摘要:
A vertical JFET architecture. Generally, an integrated circuit structure includes a semiconductor area with a major surface formed along a plane and a first source/drain doped region formed in the surface. A second doped region forming a channel of different conductivity type than the first region is disposed over the first region. A third doped region is formed over the second doped region having an opposite conductivity type with respect to the second doped region, and forming a source/drain region. A gate is formed over the channel to form a vertical JFET.
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